While it is obvious that boundary-scan based testing can be used in the
production phase of a product, new developments and applications of the
IEEE-1149.1 standard have enabled the use of boundary-scan in many other
product life cycle phases.
JTAG - Joint Test Action Group set the foundations
for the standard
1149.1-1990 - Original standard issued in 1990
1149.1a-1993 - Added supplement A, rewrite of the
chapter describing the boundary register
1149.1b-1994 - Supplement B - formal description
of the boundary-scan Description Language
1149.1c-2001 - Corrections, clarifications and enhancements
of IEEE Std 1149.1a and Std 1149.1b. Combines 1149.1a & 1149.1b
1149.4 - deals with test for mixed signal and analog
assemblies
1149.5 - deals with test at system level 1149.2 has
merged with
1149.6 - includes AC-coupled and/or differential
nets.
1532 is a derivative standard for in-system programming
of digital devices
You can also obtain a copy of the standard from www.ieee.org.
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