RTEMS open-source RTOS ported to Atmel AT91RM9200 board

New Corelis system offers practically unlimited scaleability

New from Corelis, ScanExpress enables concurrent (gang) testing and in-system programming of Flash devices and CPLDs for up to 1,024 boards using a single PC and a single operator. The ScanExpress family of products dramatically increases the test and in-system programming throughput by applying new proprietary techniques tailored specifically for optimizing boundary-scan operating speed.

ScanExpress concurrently applies test and programming vectors to each of its TAPs while simultaneously verifying results in hardware at each individual TAP, with sustained test clock (TCK) frequencies reaching 80 MHz. The ScanExpress High-Performance Boundary-Scan Test and In-Circuit Programming System is targeted specifically at users whose applications demand the highest possible scan vector throughput and high-volume production.

ScanExpress has an intelligent boundary-scan architecture that can be used in the testing and programming of devices, boards or systems compliant with IEEE Std 1149.1. The ScanExpress system offers excellent performance due to its large array of performance-enhancing innovations that increase test vector throughput. Boundary-Scan test vectors developed with Corelis's ScanPlusTPG Test Program Generator can be executed directly on the ScanExpress system.

The ScanExpress System is comprised of scalable components designed to work together to support an unlimited variety of concurrent testing and in-circuit programming configurations. Core elements of this system include the highly advanced PCI-1149.1/Turbo boundary-scan controller and the ScanExpress Runner software; a powerful yet easy to use Test Executive designed specifically for high-volume applications. Additional modules can then be added depending on the volume demands of the user.