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New Corelis module extends JTAG test

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Programmable Digital I/O is LVDS-capable

ScanIO-300LV from Corelis is a JTAG boundary-scan controlled digital moduleThe new ScanIO-300LV from Corelis is a JTAG boundary-scan controlled digital module targeted at development, manufacturing, and service test applications for complex circuit boards and IC's, which turns an IEEE-STD-1149.1 boundary-scan controller into a powerful digital interconnect tester.

Acting as a Programmable Digital I/O module, the ScanIO-300LV uses boundary-scan compatible logic to add control and visibility to connectors, traces, and logic that are otherwise not testable using traditional JTAG boundary scan techniques, allowing the benefits of automated boundary-scan testing to be extended to individual IC testing, board testing including edge connectors and cable testing. The ScanIO-300LV, combined with a boundary-scan controller, operates like a traditional "bed of nails" test system, except access to the stimulus-and response I/Os is achieved via boundary-scan, and the size and the cost of the system are significantly smaller than traditional testers.

The voltage levels of the I/O and JTAG interfaces of the ScanIO-300LV are programmable from 1.25V to 3.3V and support either single-ended or Low Voltage Differential signaling (LVDS). The ScanIO-300LV supports up to 300 (or 150 differential LVDS pairs) boundary-scan controllable digital I/O lines per module. Each line is an independently controlled bi-directional signal and can be individually configured as an input, an output or both. Multiple ScanIO-300LV modules can be cascaded to support up to thousands of digital I/O lines.

The new module offers low voltage support down to 1.25v, and provides the facility to test LVDS interfaces, widely used in applications such as High-Speed Printers, Telecom Line Cards, Network Routers and Switches, Wireless Base Stations, Set Top Boxes, Game Consoles and Electronic Warfare Systems. For semiconductor companies or ASIC developers that want to verify the boundary-scan test logic in their devices that contain boundary-scannable LVDS pins, the ScanIO-300LV provides a mechanism for doing this.

During testing, the programming and control of the test channels is automatically performed by the ScanPlus/ScanExpress tools without any user intervention. The ScanIO-300LV integrates seamlessly with the ScanExpress Test Program Generator and does not require modifications to the UUT Netlist nor merging the UUT Netlist with the ScanIO-300LV data to create test patterns for the combined configuration. This product will greatly assist engineers to increase the boundary-scan test coverage of their products, providing savings in test hardware and software costs.

ScanIO-300LV is available in the UK and Ireland exclusively from JTAG boundary scan test specialist Direct Insight. Further details are available in our boundary scan section.

 




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