JTAG and Extended Functional Test UK Seminars

Boundary scan and functional testing have always remained separate test processes. The ability to combine them is a breakthrough, Corelis and Direct Insight are co-hosting free seminars on their new products, designed to realize this new capability, and to combine functional test with JTAG test, using the same test hardware, the same GUI, harnessing the JTAG emulation/debug feature of modern CPUs to download and control processor-specific test suites via JTAG.

The new technology called JET - JTAG Emulation functional Test - is covered in three one-day in-depth technical seminars, which also cover the latest advances in boundary scan testing and in-system programming. The seminar will provide practical tips and strategies to lower the cost of design, test, and support for users.

Seminars will be held in the second week of July at locations including Birmingham, Bracknell and Cambridge. For further information, please visit our Boundary Scan seminar pages

Boundary Scan seminar pages