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Testing
and in-system programming on four JTAG chains
The new Corelis NetUSB-1149.1/E high performance, intelligent boundary-scan controller can be connected either to a user's PC via the high-speed USB 2.0 (Universal Serial Bus) or a 10/100BaseT Ethernet LAN interface. In addition to providing the ease and flexibility of connection associated with both USB and LAN interfaces, the NetUSB-1149.1/E offers testing and in-system programming of CPLDs, FPGAs, and Flash memories on up to four concurrent (ganged) JTAG chains. This feature comprises the ability to deliver test vectors at a sustained test clock (TCK) frequency of 80 MHz on all four JTAG chains while simultaneously verifying results in hardware at each individual TAP.
Voltage of each TAP can be set to any voltage between 1.3V to 3.3V and the slew rate (fast/slow) can also be adjusted
The unit also has built in signal delay compensation for high clock rates and extended distances, pre-power up test for shorts between power and ground lines and is fully compatible with Corelis ScanPlus family of products.
For further information, please call or visit our download section for a full datasheet.
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