USB JTAG/I2C/SPI Controller

New from Corelis, a USB 2.0 based boundary-scan test and in-system programming controller which offers board testing and in-system programming of CPLDs, FPGAs, and flash memories at their full theoretical programming speed. With its ability to deliver test vectors at a sustained test clock (TCK) frequency of 100 MHz, the USB-1149.1/4E is being offered as the premier solution for users whose applications demand the highest possible performance and scan data throughput.

In addition to the boundary-scan test features, the USB-1149.1/4E also includes direct I2C and serial peripheral interface (SPI) based device programming capabilities. The SPI and I2C interfaces are independent of the JTAG test interface, meaning the same boundary-scan controller tests the board and performs direct programming of serial EEPROM and flash memories, without operators having to remove the JTAG connector or switch to a dedicated SPI or I2C programmer. The USB-1149.1/4E also features automatic signal delay compensation for long cable runs to the UUT, slew rate control, adjustable input thresholds, software controllable signal pin reassignment and eight analog channels for measuring target supply voltages or other signals up to +5VDC.

The USB-1149.1/4E interfaces with the host computer via the industry standard high-speed USB 2.0 (Universal Serial Bus). The host software then provides direct access to hardware for boundary-scan testing and In-System-Programming in various phases of a product life cycle such as design, manufacturing, and field service.

The USB-1149.1/4E controller ships with cables, built-in self-test software, and plug-and-play Windows 2000/XP device drivers. The USB-1149.1/4E controller is available now - please call for pricing.

Further details of our JTAG boundary scan products can be found in the Corelis section.