JTAG controller

The new NetUSB-1149.1/SE boundary-scan (JTAG) controller from Corelis combines the flexibility of networking, the simplicity of a USB interface, and the power to run boundary-scan tests and program Flash memory devices on up to 8 targets simultaneously. The NetUSB-1149.1/SE is an advanced multiple-port boundary-scan controller with 8 TAPs that enables engineers to test and program complex boards with up to eight TAPS or concurrently run boundary-scan tests and program CPLDs, FPGAs and Flash memories on up to 8 JTAG chains.

The NetUSB-1149.1/SE includes an expansion connector that allows parallel testing and programming on up to thousands of boards using optional expansion modules available from Corelis. The NetUSB-1149.1/SE provides the highest possible scan vector throughput that is currently available in the market. Test vectors are delivered at a sustained test clock (TCK) frequency of 70 MHz on 8 boundary-scan chains while simultaneously verifying results in hardware at each individual TAP. Its standard USB 2.0 or LAN connectors eliminate the requirement to open a PC to install additional cards. This product was designed to meet the needs of engineers in the lab or production environment who require faster and more efficient testing, programming and debugging of multiple UUTs (Units Under Test) or of a single UUT with multiple scan chains.

Additional features of NetUSB-1149.1/SE include automatic signal delay compensation for long cable runs to the UUT; the ability to test the UUT for shorts between power and ground nets and the availability of up to 16 analog channels for measuring target supply voltages or other signals up to +/- 50VDC. The NetUSB-1149.1/SE is now available for shipment and is compatible with the complete line of Corelis ScanPlus and ScanExpress boundary-scan test tools.

Learn about JTAG Boundary Scan in our technology section.